 Physics Research Topics
Nano-structure analysis of films and devices by three-dimensional atom probe for spin-electronics
Explanation
A complex metallic multilayer structure with a nano-oxide layer (NOL) has been developed for future spin-electronics devices. This project is aimed at nano-structure analysis for the above films and devices by three dimensional atom probe. The correlation between atom probe data and device data needs to be compared in order to understand the physical phenomena in the devices.
Knowledge and Skills required
Candidates should possess expertise in solid state physics, material science, and thin film physics. |
Terms and Conditions